christoph.neururer@unifr.ch
 +41 26 300 8925

• Microscopie Electronique à Balayage (MEB), Energie Dispersive X-Ray Micro Spectrometrie (EDS), Electron   Backscattered Diffraction (EBSD), Cathodoluminescence (CL),automated Particle Analysis and sample preparation for SEM.
• Focussed Ion Beam (FIB)
• x-ray Micro Computer Tomography (Micro CT) with Avizo 3D image analysis
• x-ray Fluorescence Spectroscopy (XRF)
• x-ray Powder Diffraction (XRD)
• Developement de Prototype pour la recherche