Name: Optical ellipsometry: A tool for in-situ monitoring of thin film quality, charge transfer and emergent magnetism
Start: 2023-02-27T14:00:00+01:00
End: 2024-11-23T19:54:26+01:00
Location: PER 08, 1.58

Agenda

Vergangene Events

27
Feb.

Optical ellipsometry: A tool for in-situ monitoring of thin film quality, charge transfer and emergent magnetism

Spezialisiert / Akademisch Seminar

27.02.2023 14:00

Präsenzveranstaltung

PER 08 1.58, Chemin du Musée 3, Fribourg

Wann?	27.02.2023 14:00
Wo?	PER 08 1.58 Chemin du Musée 3, 1700 Fribourg
Vortragende	Dr Fryderyk Lyzwa Photon Factor, University of Auckland, New Zealand
Kontakt	Département de Physique prof. Christian Bernhard christian.bernhard@unifr.ch

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